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Numerical Simulation of Flaw Detection with a Capacitive Array Sensor Using Finite and Infinite Elements

机译:基于有限元和无限元的电容阵列传感器缺陷检测的数值模拟

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摘要

Capacitive array sensors are one among many electromagnetic techniques that can be used to detect flaws or other irregularities at or near the surface of materials. Capacitive sensors have an advantage over inductive sensors in that insulating materials may be interrogated as well as conducting materials. These sensors have seen some application in nondestructive evaluation, including flaw detection, the monitoring of porosity and thickness of thermal barrier coatings, dielectric cure monitoring, and robotic proximity sensing [1, 2]. Only surface features can be examined on metallic plates because the accumulation of surface charges blind the capacitive probe to interior features. In dielectric materials, both surface and subsurface features can be examined.
机译:电容阵列传感器是许多电磁技术中的一种,可用于检测材料表面或表面附近的缺陷或其他不规则性。电容传感器比电感传感器具有优势,因为可以查询绝缘材料以及导电材料。这些传感器已经在无损评估中得到了一些应用,包括探伤检测,热障涂层的孔隙率和厚度监控,介电固化监控以及机器人接近感测[1,2]。只能在金属板上检查表面特征,因为表面电荷的积累使电容式探头看不到内部特征。在介电材料中,可以检查表面和地下特征。

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